IC Test

CALIBER offers low cost optimized ATE Test engineering services including full turn key testing as well as test consulting services across multiple ATE platforms for Digital, Analog, Sensors, Mixed Signal, and RF devices for high yield.

We support our customers from prototype to production test by managing the test solution development and debug activities.

  • Full turn-key development and testing
  • Test Program Conversion between different ATE Platforms
  • Test engineering services and test program development
  • High Volume Production testing enablement at SAT houses
  • Test Engineering Support & Training
  • Test Hardware development
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Tools and Test Platform Expertise

  • Advantest (Verigy) 93K
  • Advantest T2K
  • Teradyne J750
  • Teradyne Flex
  • Teradyne Eagle

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We offer a wide range of ATE testing services on leading test platforms, including

  • Feasibility Study
  • Load Board and Probe Card Design
  • Hardware Bring-Up and Validation
  • Digital / Mixed Signal / RF Test Program Development (Package Test & Wafer Sort)
  • Simulation to Test Pattern Conversion
  • Silicon Debug
  • Tester Remote Access Support
  • Device Characterization
  • Multisite-Parallel Device Testing
  • Yield Enhancement
  • Test time Optimization
  • Throughput Improvement